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Calibration Artifact: 180nm Depth
Both coatings are available on 50nm and 200nm PELCO® Silicon Nitride Membranes with a 0
Note: special numbering sequence sets are limited to four digits and are non-returnable
StrataTek™ grids have a slightly higher density than grids made by electroplating
025 Ωcm Silicon Cantilever Thickness (Nom): 1 - 2 Cantilever Thickness (RNG): 2
ContGB-G Select Quantity:10 per set Calibration Artifact: 180nm DepthGold Coated Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Not
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