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these tips are formed from tungsten wire by mechanical cutting
75 Cantilever Thickness (RNG): 2
Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful
FASTForce Volume
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RESP-40
AC-SPK 292 kHz these tips are formed fromDESCRIPTION This kit contains a selection of parts often used to mount samples for AFM based analysis. The kit contains 20 12mm steel sample pucks, a sheet of 50 adhesive dots for adhering the sample to the steel pucks, and tweezers.
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