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Ships within 48 hours · Estimated delivery Nov 10 - Nov 15
The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option
Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Set Back( RNG): 5 - 15 Tilt Compensation: cell2
Unmounted for use on standard AFM's
For more information about this sample
Symmetric Tip
ESP-V2 Carbon Coated The Sample Bias Holder is0. 2N m, 13kHz, 4 Sided Tip, No Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, ESP ESPA AFM probes. Brukers new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air. The new design
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