Low profile flat FIB pin mount with short pin (6mm) for ZEISS/LEO systems Unit:pkg/10 The PELCO X-Checker™ Wafer is

The PELCO X-Checker™ Wafer is available on standard 200mm (8") and 300mm (12") wafers

PELCO® Silicon Nitride Support Films provide more accurate analysis of specimens containing carbon

6x harder than stainless steel

All cantilevers have less than +/- 2 deg bend

Excellent corrosion resistance to most chemicals

Low profile flat FIB pin mount with short pin (6mm) for ZEISS/LEO systems Unit:pkg/10 The PELCO X-Checker™ Wafer isDESCRIPTION These special low profile pin mounts are available as flat, as a 90 mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made out of aluminum. Fully compatible with standard pin stub mounts (pin 3. 2mm diameter) for sample storage and transport. These mounts can be used directly in FEI and TESCAN systems with the standard pin length and ZEISS LEO