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Triple Flat Sample Clip Holder AFM and Scanning Probe Microscopy Calibration 8N/m spring constant

SKU: 52915776491

4.4
USD337.77 USD365.77

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Ships within 48 hours · Estimated delivery Nov 16 - Nov 21

Description

8N/m spring constant

The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option

16326-20 - PELCO SEMClip™

References:

Bruker's flagship RESP probes are the preferred choice for high-sensitivity silicon probe imaging in contact mode in air

Triple Flat Sample Clip Holder AFM and Scanning Probe Microscopy Calibration 8N/m spring constantDESCRIPTION Interchangeable Modular SEM Specimen Holders This extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS LEO dovetail stage adapter one of the adapter buttons 15372 or 15372 10 is needed. Triple Flat Sample Clip Holder, M4 shown with silicon chips held in place This specimen holder is made from aluminum with spring loaded clamping and

Exchange/Return Notes
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