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nanoindentation
Calibration Artifact: 180nm Depth
This optional certified step height calibration standard provides high accuracy
3 MESP-LM-V2 probes
while the copolymer regions have elastic modulus numbers around 0
PR-EX-TnIR-A-10 0.2 N/m nanoindentationDESCRIPTION SPECIFICATIONS 10 pack of probes for use in the nanoIR2 2S 2FS systems for AFM imaging in Tapping mode and IR spectral collection in contact mode. Also required for Tapping AFM IR chemical imaging where the feature is available. Gold coated, microfabricated silicon probes that are ~225 microns long and come pre mounted on half washer mounts for easy exchange in the AFM head. Shape: Rotated Height: 17 m (15 19 m)* Setback: 15 m (10 20 m)*
