SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools High aspect ratio probe based

High aspect ratio probe based upon Bruker technology and made from our TESP

This includes thin film samples of polycaprolactone (PCL

Splash guards are included with purchase of fluid cantilever holders

The pattern is coated with a proprietary conductive material which allows for SEM imaging at any accelerating voltage

- Topography imaging in PeakForce Tapping

SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools High aspect ratio probe basedDESCRIPTION Modify the MRS 4 to 3mm diameter x 0. 5mm thickness to fit into a TEM style holder. For use only in secondary or backscattered mode, not transmitted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies