Mitutoyo Outside Micrometer Interchangeable Anvil 0-2" 104-165 Indicators Bowers XT500 large diameter 3-point

Bowers XT500 large diameter 3-point bore-gauge

or in test stand controlled applications with the TSTM-DC torque test stand

First / second peak detection for slip and breakaway torques in tamper evident closures

Leeb hardness testing was invented in 1975 in Switzerland and has become one of the most popular portable testing methods currently available

Mass: 430 g

Mitutoyo Outside Micrometer Interchangeable Anvil 0-2" 104-165 Indicators Bowers XT500 large diameter 3-pointMitutoyo; Micrometer with Interchangeable Anvil A Mitutoyo non digital micrometer provided with easily interchangeable anvils to enable a wide measuring range from one instrument. A ratchet stop guarantees repeatable measurement. All images are for representation only.